发明名称 METHOD AND APPARATUS FOR MEASURING THE SURFACE CONDITION
摘要 <p>A method and an apparatus for measuring surface coarseness, ruggedness, scars, degree of oxidation, discoloration and the like of materials. The operation is carried out such that an intersecting point P of the optical axis of a source of light (1) and of the optical axis of a light-receiving element (2) is positioned on a plane (4a) that is to be measured and another operation is carried out to move the source of light (1) and the light-receiving element (2) along the spherical surface with the intersecting point P as a center over a predetermined range, until the detect output of the light-receiving element reaches a maximum value. Thus, measurement can be carried out under predetermined conditions at all times, and the measuring precision is greatly improved compared with that of the prior art.</p>
申请公布号 WO1990001142(P1) 申请公布日期 1990.02.08
申请号 JP1989000732 申请日期 1989.07.21
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