发明名称 |
Semiconductor memory device provided with an improved system for detecting the positions using a redundant structure. |
摘要 |
<p>A semiconductor memory device provided with an improved system for detecting an address of a defective column or row of memory cells replaced by a redundant column or row of memory cells through an output port comprises normal memory cells, at least one redundant memory cell, a power-on detection for generating a detection signal when a power supply to the memory circuit is switched on, a first circuit for initializing the normal memory cells at a first logic state in response to the detection signal, and a second circuit for initializing the redundant memory cell at a second logic state different from the first logic state in response to the detection signal.</p> |
申请公布号 |
EP0352730(A2) |
申请公布日期 |
1990.01.31 |
申请号 |
EP19890113687 |
申请日期 |
1989.07.25 |
申请人 |
NEC CORPORATION |
发明人 |
MIZOGUCHI, AKANE C/O NEC CORPORATION |
分类号 |
G11C29/04;G06F11/20;G11C7/20;G11C29/00;G11C29/44 |
主分类号 |
G11C29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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