发明名称 ABNORMAL DIAGNOSIS INFORMING SYSTEM
摘要 <p>PURPOSE:To accurately forecast state measurement and state change also in a system lacking in the reliability of a measured value by collating a measurement pattern obtained from a sensor signal patterning processing part with a pattern in an abnormality inference knowledge data base by inference. CONSTITUTION:A sensor signal is patterned by a sensor signal patterning processing part 2 and inference is executed by using the signal pattern of a condition model to be diagnosed stored in the abnormality inference knowledge data base 3 or a decision reference to totally grasp the state of the object to be measured. Consequently, the measuring accuracy can be improved and abnormality can be accurately judged also from measurement data from which the state of the object can not be grasped by an ordinary system because sensors 1, 1', 1'' can not be sufficiently arranged.</p>
申请公布号 JPH0229894(A) 申请公布日期 1990.01.31
申请号 JP19880180530 申请日期 1988.07.20
申请人 ADOIN KENKYUSHO:KK 发明人 NAKAMURA TAKESHI;UEISHI YOICHI;HORIKAWA TAKAHARU;YAMAGUCHI HIDETOSHI
分类号 G08B23/00;G05B23/02;G06F9/44;G08B31/00 主分类号 G08B23/00
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