发明名称 Automated testing apparatus for screen alignment
摘要 The present invention is an automated testing apparatus and process for screen alignment involving a pattern generator, sensors, and an analysis computer. Two sets of patterns are displayed on the screen being tested. Sensors are used to observe patterns on the screen. An analysis computer receives the data from these observations and then compares the observed data to data from an ideal screen to determine the screen's alignment parameters.
申请公布号 US4897721(A) 申请公布日期 1990.01.30
申请号 US19880194497 申请日期 1988.05.16
申请人 APPLE COMPUTER 发明人 YOUNG, STEPHEN J.;BLACKWELL, MIKE K.;DOWLING, KEVIN J.;MORAVEC, HANS P.;ZAJICEK, LADA
分类号 H04N17/04 主分类号 H04N17/04
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