发明名称 PROCESS FOR MAKING SEMICONDUCTOR DEVICES USING HIGH TEMPERATURE TREATMENT IN AN OXIDIZING ENVIRONMENT
摘要 <p>A process is provided for fabricating a semiconductor structure wherein the structure has to be exposed to certain oxidizing conditions during certain of its processing steps, such as its high temperature annealing in an oxidizing ambient. It includes depositing a "sacrificial" layer, such as silicon, to provide a uniformly oxidizing surface during subsequent annealing operations. This sacrificial layer, which oxidizes uniformly, produces an oxide layer which also etches uniformly. Thus, after the annealing is completed, the surface oxide is removed through etching and the sacrificial layer is then also removed through a different etching step.</p>
申请公布号 EP0158715(B1) 申请公布日期 1990.01.24
申请号 EP19840114427 申请日期 1984.11.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GEIPEL, HENRY JOHN JR.;SCHAEFER, CHARLES ANDREW;WHITE, FRANCIS ROGER;WURSTHORN, JOHN MICHAEL
分类号 H01L21/22;H01L21/314;H01L21/316;H01L21/318;H01L21/321;H01L21/324 主分类号 H01L21/22
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