| 摘要 |
1. Matrix device for measuring a pressure distribution on any plane or non-plane surface, comprising pressure-sensitive elements, consisting of a deformable conductor (C i , j ) placed between two layers of conductors (A1 , A2 ... Ai ... An ; B1 , B2 ... Bj ... Bm ) carried by two parallel surfaces (SIGMA A ; SIGMA B ) on which the pressure to be measured is exerted, in such a manner that it is connected via a diode in series to a first point of the first layer of conductors (A1 , A2 ... Ai ... An ) and to a second point of the second layer of conductors (B1 , B2 ... Bj ... Bm ), and that the current which passes through it with a direction substantially perpendicular to these two parallel surfaces (SIGMA A ; SIGMA B ) is used, in relation to the voltage applied to the circuit, to measure the resistance of the pressure-sensitive element consisting of the said deformable conductor (C i , j ) and consequently the pressure applied to this same element ; and in that the sequence of measurement of the pressure at the various points of the pressure-sensitive element consisting of the said deformable conductor (C i , j ) is performed by means of electronic switches (C Ai ; C Bi ), using, for example, MOS technology and which are controlled by multiplexing, in such a manner that all the pressure-sensitive elements constituted by the said deformable conductor (C i , j ) are alternately connected to the terminals of a power supply (2), with, in series, a resistor (3) which permits the measurement of the current passed through ; characterized in that these pressure-sensitive elements are piezoresistive elements, in that the said diode is a Zener diode, and in that there is added to the piezoresistive network another network, but this time comprising thermoresistive elements, operating in a similar manner but using as sensitive element (D i , j ) thermistors or any other temperature-sensitive resistive element, which permits the correction of the pressure measurement for the effects of temperature. |
