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发明名称
INSPECTING METHOD FOR SEMICONDUCTOR DEVICE
摘要
申请公布号
JPH0220037(A)
申请公布日期
1990.01.23
申请号
JP19880170340
申请日期
1988.07.07
申请人
MATSUSHITA ELECTRON CORP
发明人
MIYATSUJI KAZUO
分类号
G01R31/26;G01R31/28;H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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