发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
The methode of manufacturing a semiconductor device comprises : (4) forming a polycrystalline or amorphous semiconductor layer (32) on the surface of a substrate of insulating material, or on a substrate obtained by forming an insulating layer (31) on a semiconductor base (30) ; (B) producing an island from the semiconductor layer surrounded by dielectric materials obtained from the semiconductor layer ; (C) forming a Si3N4 (37) film on the island, or on a film of SiO2 formed on the island (32) ; (D) removing the Si3N4 film except from a predetermined region on the island ; (E) irradiating the island with a beam of energy by sweeping so as to melt and recrystallise the island.
|
申请公布号 |
KR900000061(B1) |
申请公布日期 |
1990.01.19 |
申请号 |
KR19840007513 |
申请日期 |
1984.11.29 |
申请人 |
MITSUBISHI DENKI CO.LTD. |
发明人 |
GUSUNOKI SIGERU;NISIMURA DADASHI;SUGAHARA KAZUYUKI |
分类号 |
H01L27/00;H01L21/20;H01L21/268;H01L21/762;H01L29/78;H01L29/786;(IPC1-7):H01L21/268 |
主分类号 |
H01L27/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|