发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 The methode of manufacturing a semiconductor device comprises : (4) forming a polycrystalline or amorphous semiconductor layer (32) on the surface of a substrate of insulating material, or on a substrate obtained by forming an insulating layer (31) on a semiconductor base (30) ; (B) producing an island from the semiconductor layer surrounded by dielectric materials obtained from the semiconductor layer ; (C) forming a Si3N4 (37) film on the island, or on a film of SiO2 formed on the island (32) ; (D) removing the Si3N4 film except from a predetermined region on the island ; (E) irradiating the island with a beam of energy by sweeping so as to melt and recrystallise the island.
申请公布号 KR900000061(B1) 申请公布日期 1990.01.19
申请号 KR19840007513 申请日期 1984.11.29
申请人 MITSUBISHI DENKI CO.LTD. 发明人 GUSUNOKI SIGERU;NISIMURA DADASHI;SUGAHARA KAZUYUKI
分类号 H01L27/00;H01L21/20;H01L21/268;H01L21/762;H01L29/78;H01L29/786;(IPC1-7):H01L21/268 主分类号 H01L27/00
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