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发明名称
IC TESTING DEVICE
摘要
申请公布号
JPH0216472(A)
申请公布日期
1990.01.19
申请号
JP19880164923
申请日期
1988.07.04
申请人
HITACHI ELECTRON ENG CO LTD;HITACHI LTD
发明人
KUTSUNO TAKAO;HIRAISHI AKIHIKO
分类号
G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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