发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 <p>PURPOSE:To protect semiconductor substrates that are brittle from mechanical shocks from outside and improves workability and yield by a method wherein the sides of a chip semiconductor substrate are covered with a metal protective film. CONSTITUTION:On the main surface of a GaAs substrate 2, a working layer 3, a drain electrode 4, a gate electrode 5 and a source electrode 6 are built, as in the conventional technique. Isolation grooves 13 are provided in the surface for the separation of the GaAs substrate 2 into chips, and the GaAs substrate 2 is thinned out from the rear side until the bottoms of Hall electrodes 10 are exposed. The entirety of the rear surface is used as a rear side electrode 7, on which a Ti/Au or Ni/Au film is deposited by evaporation or electroless deposition and AuPHS(Plated Heat Sink) is formed 60mums thick. A PHS 8 is isolated along the isolation grooves 13 using for example a die for the segmentation of the wafer into FET chips 101. In this way, a brittle GaAs substrate 2, covered with a metal protective film 7a on its sides, is protected from mechanical shocks from outside, which also greatly facilitates the handling thereof.</p>
申请公布号 JPH0215652(A) 申请公布日期 1990.01.19
申请号 JP19880165752 申请日期 1988.07.01
申请人 MITSUBISHI ELECTRIC CORP 发明人 KOBIKI MICHIHIRO;YOSHIDA MASAHIRO;ISHIKAWA TAKAHIDE
分类号 H01L23/52;H01L21/301;H01L21/3205;H01L21/74;H01L21/78;H01L23/00;H01L23/36;H01L23/48;H01L23/58 主分类号 H01L23/52
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