| 摘要 |
PURPOSE:To prevent the electrostatic breakdown of the IC when a pin is contacted with the IC terminal by providing the conductor section base end side with a resistor section at the tip of the contact pin. CONSTITUTION:The contact pin 1 is pushed up by a spring 5 first, a base 6 is contacted electrically with the resistor 2, and an external circuit is connected to the base 6. When a film carrier IC charged is inspected, electrostatic charges pass through the semiconductor section 1a of the pin, the resistor 2 and the base 6 and are grounded through the external circuit when the tip of the pin 1 is contacted with the IC terminal 7. The IC is not broken by impulse currents because the value of the resistor 2 is large at that time. When the terminal 7 is further pushed down, the pin 1 drops against the force of the spring 5, the resistor 2 falls gradually from the position of a flange 6a and resistance value decreases, and the resistor 2 is short-circulated and test voltage can be applied directly to the IC terminal when the inner wall 6b of the flange is contacted with the conductor 1a. When the IC is tested by using the terminal having the constitution, the electrostatic breakdown of the IC can be prevented. |
