发明名称 Method and device for determining the deviation of the energy of a particle probe from the neutral point energy
摘要 Due to the low capacitance of the circuit nodes of modern microelectronic components, quantitative measurements of potential with the electron probe should be carried out electrically load-free, that is to say charge-neutral. In conventional electron beam measuring devices the condition iPR = 0 (iPR = probe current), valid for electrically load-free measurements, can, however, be met only approximately by a suitable choice of the electron energy, since the neutral point energy of the measurement point is usually not known. It is therefore proposed to determine the deviation of the electron energy from the respective neutral point energy by measuring the effect of electron irradiation on the discharge behaviour of a capacitance. <IMAGE>
申请公布号 DE3823911(A1) 申请公布日期 1990.01.18
申请号 DE19883823911 申请日期 1988.07.14
申请人 SIEMENS AG, 1000 BERLIN UND 8000 MUENCHEN, DE 发明人 BRUST, HANS-DETLEF, 6602 DUDWEILER, DE
分类号 G01R31/305;H01J37/26 主分类号 G01R31/305
代理机构 代理人
主权项
地址