| 摘要 |
PURPOSE:To execute diagnosis with a high rate at a high speed by providing an input turning-back means, a self-diagnosing means, and an output turning- back means correspondingly to each logic element and selectively performing input turning-back diagnosis, internal diagnosis, and output turning-back diagnosis for each logic element in accordance with diagnostic information. CONSTITUTION:Input turning-back means 10 and 11, self-diagnosing means 32, 33, and 34, and output turning-back means 14 and 15 or 16 and 17 for each logic element 3 are provided correspondingly to each logic element (processor) 3. Diagnostic information 1 is provided which includes at least the logic element number of the diagnosis object, the diagnosis route number, designation of self-diagnosis of the logic element, input/output turning-back information of diagnostic information, and test data. Each of plural logic elements 3 mounted on a printed board 1 is selectively subjected to input turning-back diagnosis, internal diagnosis, and output turning-back diagnosis repeatedly by diagnostic information 1 to diagnose the entire printed board 1. |
