| 摘要 |
<p>PURPOSE: To carry out testing of functional circuits individually at real time by mutually connecting test interface circuits in a plurality of macro-circuits and connecting a test bus to an input/output of the functional circuits in an optional macro-circuit. CONSTITUTION: A plurality of macro circuits M (M1, M2) are constituted of functional circuits F, test interface circuits T, and connecting means K. The test interface circuits T are respectively connected through data lines (d) in series connection and the mutual connection lines are suppressed to be in the minimum number. Based on the output of the test interface circuits T, switches SI and SO are controlled by the connecting means K and a specified functional circuit F is enabled to be connected with a test bus (b). Consequently, without connecting a macro circuit with another macro-circuit at the time of a testing mode, a testing can be carried out individually at real time through the test bus b.</p> |
