SEMICONDUCTOR INTEGRATED CIRCUIT HAVING TEST TERMINAL,申请号JP19880160508-传众专利搜索

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发明名称	SEMICONDUCTOR INTEGRATED CIRCUIT HAVING TEST TERMINAL
摘要
申请公布号	JPH0210176(A)	申请公布日期	1990.01.12
申请号	JP19880160508	申请日期	1988.06.28
申请人	NEC CORP	发明人	ISHIDA TOYONORI
分类号	G01R31/28;H01L21/66;H01L21/82;H01L21/822;H01L27/04;H01L27/118	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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