发明名称 METHOD OF REWRITING NONVOLATILE MEMORY
摘要 <p>PURPOSE:To substantially increase a number of possible rewriting operations in an EEPROM having floating gate structure, by baking the EEPROM always after repeating a certain number of rewriting operations. CONSTITUTION:A floating-gate-type EEPROM assembled into a package is subjected to up to 10<5> rewriting operations by a conventional rewriting process. The EEPROM in the packaged state is then introduced into a baking furnace at a temperature higher than 200 deg.C and left therein for about 5 hours. The EEPROM is taken out of the furnace and subjected to 10<5> rewriting operations by an ordinary rewriting process. Then, the EEPROM is baked again. By repeating this cycle, a number of possible rewriting operations can be increased substantially.</p>
申请公布号 JPH023981(A) 申请公布日期 1990.01.09
申请号 JP19880152389 申请日期 1988.06.22
申请人 MATSUSHITA ELECTRON CORP 发明人 SATO KAZUO;FUKUZAKI YOSHIKI
分类号 G11C17/00;G11C16/02;G11C16/06;H01L21/8247;H01L27/10;H01L27/115;H01L29/78;H01L29/788;H01L29/792 主分类号 G11C17/00
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