Inspection mechanism for chip type circuit element

摘要

An inspection mechanism for a chip type circuit element which is capable of readily and effectively inspecting various kinds of chip type circuit elements different in number of terminals thereof from each other with a simple structure. The inspection mechanism includes a plurality of checking bars arranged in a row on each of both sides of a position at which a chip type circuit element is to be extracted from a chip tape. The checking bars on each side are electrically switchable in a manner to be alternatively electrically independent from or integral with one another.