IC grabber probe

摘要

An electrical test probe has a electrically conductive hollow elongate body with an exterior coating of electrically insulative material. An output connector is formed by soldering an electrically conductive wire to the exterior of the elongate body. A hooked gripping tip for probing Integrated circuit devices and the like is formed on one end of a conductive shaft inserted into the elongate body. Axial movement of the conductive shaft relative to the elongate body alternately extends and retracts the hooked gripping tip out of and into the elongate body. The electrically conductive elongate body provides a low contact resistance path between the gripping tip and the output connector.