发明名称 METHOD AND APPARATUS FOR MEASURING MOMENTS ACTING UPON AN OBJECT UNDER MEASUREMENT
摘要 <p>: A method and apparatus for measuring at least one moment acting about a predetermined axis on an object under investigation. A force component acting at a first force introduction point onto said object under investigation perpendicular to a normal from said first introduction point to said axis is measured. Then a differential moment caused by displacement of said object between said first force introduction point to a present second force introduction point is determined and said displacement is calculated by dividing said differential moment by said measured force component. A predetermined distance between said first force introduction point is corrected by said displacement and finally said measured force component is multiplied by said corrected distance in order to gain an accurate value for the moment to be measured.</p>
申请公布号 CA1264020(A) 申请公布日期 1989.12.27
申请号 CA19860503389 申请日期 1986.03.05
申请人 PFISTER G.M.B.H. 发明人 HAEFNER, HANS W.
分类号 G01L5/16;(IPC1-7):G01L3/14;G01M9/00 主分类号 G01L5/16
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