CIRCUIT FOR MEASURING CHARACTERISTICS OF A DEVICE UNDER TEST,申请号EP19860101126-传众专利搜索

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发明名称	CIRCUIT FOR MEASURING CHARACTERISTICS OF A DEVICE UNDER TEST
摘要
申请公布号	EP0192981(B1)	申请公布日期	1989.12.27
申请号	EP19860101126	申请日期	1986.01.29
申请人	HEWLETT-PACKARD COMPANY	发明人	TOSHIO, TAMAMURA
分类号	G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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