| 摘要 |
<p>A test facilitating circuit comprises an arithmetic block (LB) to be tested including an arithmetic unit for operating multiple bits as well as including various registers related to the arithmetic unit. The test facilitating circuit further comprises flip-flops (FF) for receiving data from a first pin (P1) and forming a shift register, multiplexers (M) for selectively generating control signals for controlling the elements in the arithmetic block to be tested, a second pin (P2) connected to the flip-flops and multiplexers to externally provide them with a test mode signal under a test mode, a bus switch (7) connected between a third pin (P3) and an internal data bus (B) to control input of test data from the third pin (P3) to the arithmetic block (LB) and input of an operation result to the third pin (P3) via the internal data bus (B), gates (G1,G2) for controlling data input and output with respect to the bus switch (7) and timing signal generator for generating timing signals for controlling the gates. At the time of test, the second pin (P2) provides the test mode signal. According to this signal, the flip-flops hold test control data, while the multiplexers generate control signals based on the timing signals to test the arithmetic block at high speed.</p> |
