TRANSISTOR STORAGE TIMING TEST CIRCUIT,申请号KR19870015923U-传众专利搜索

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发明名称	TRANSISTOR STORAGE TIMING TEST CIRCUIT
摘要
申请公布号	KR890009281(Y1)	申请公布日期	1989.12.20
申请号	KR19870015923U	申请日期	1987.09.18
申请人	SAM SUNG ELECTRONICS CO. LTD.	发明人	RYU GUN-BAE
分类号	G01R31/28;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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