发明名称 |
Programmatically generated in-circuit test of digital to analog converters |
摘要 |
A device and process for programmatically controlled in-circuit pin checks and gross functionality tests of digital to analog converters. The tests provide deterministic bit checks for higher order bits and non-deterministic or "delta" bit checks of low order bits independent of other circuitry on the printed circuit board of which the digital to analog converter is a component. |
申请公布号 |
US4888548(A) |
申请公布日期 |
1989.12.19 |
申请号 |
US19880175713 |
申请日期 |
1988.03.31 |
申请人 |
HEWLETT-PACKARD COMPANY |
发明人 |
CHISM, WAYNE R. |
分类号 |
G01R31/316;G01R31/28;G01R31/3167;H03M1/10 |
主分类号 |
G01R31/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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