| 摘要 |
<p>This type of busbar is affected by temperature and is also subjected to high mechanical stresses, in particular if a short circuit occurs. The busbars and their fastenings must be sufficiently stable to withstand these stresses. When current flows, magnetic fields build up around the busbars and lead to a higher current density in the edge regions of the busbars. This can only occur to a limited extent, however, if the busbar cross-section is increased. To this end, in the invention the wall thicknesses (5a, 5b) of the C-shaped profile cross-section are non-uniform so that the walls (5) which lie closest to each other in adjacently mounted busbars (1) have a greater thickness (5a) than the walls (6, 6') parallel to the plane of contact (3). As a result of these non-uniform wall thicknesses, the cross-sectional increase of the C-shaped profiled cross-section coincides with the region of maximum current density on the busbar. Consequently, better utilization of the cross-section for conducting current is achieved, amongst other advantages, with an overall smaller profile cross-section.</p> |
