发明名称 APPARATUS FOR ANALYZING GAS IN METALLIC MATERIAL
摘要 PURPOSE:To accurately analyze the surface state of a metallic material and to enhance the analytical accuracy in the succeeding process by providing a surface gas removing treatment chamber and an analyser for analyzing the surface state of the metallic material by Auger electron spectrum analysis. CONSTITUTION:After surface gas removing treatment is applied to the surface of a metallic in a surface gas removing treatment chamber 1, the surface state of the metallic material is analyzed by an analyser 8 for analyzing the surface state of the metal material by Auger electron spectrum analysis. By this method, the surface state of the metal material can be accurately analyzed. Therefore, the analytical accuracy of gas in the succeeding process can be enhanced.
申请公布号 JPH01308939(A) 申请公布日期 1989.12.13
申请号 JP19890077677 申请日期 1989.03.28
申请人 SHOWA ALUM CORP 发明人 KATO YUTAKA;ABE SHINYA;KITAMURA TERUO;ISOYAMA EIZO
分类号 G01N23/227;G01N1/22;G01N1/28;G01N1/36;G01N33/20 主分类号 G01N23/227
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