发明名称 Bipolar transistor structure having a reduced base resistance, and method for fabricating a base terminal zone for the bipolar transistor structure
摘要 To reduce the base resistance in a bipolar transistor structure as is used especially in large-scale-integrated (LSI) circuits, the base terminal zone is designed as a three-layer structure. The three-layer structure contains a first p-doped polysilicon layer (3), a metal silicide layer (4), a second p-doped polysilicon layer (5) and an insulating layer (6). The first polysilicon layer (3), the metal silicide layer (4) and the second polysilicon layer (5) have common vertical etching profiles. The surface and the flanks of the three-layer structure are covered with an oxide layer (6). <IMAGE>
申请公布号 DE3817882(A1) 申请公布日期 1989.12.07
申请号 DE19883817882 申请日期 1988.05.26
申请人 SIEMENS AG, 1000 BERLIN UND 8000 MUENCHEN, DE 发明人 KABZA, HERBERT, DR., 8000 MUENCHEN, DE;SCHABER, HANS-CHRISTIAN, DR., 8034 UNTERPFAFFENHOFEN, DE;PROBST, VOLKER, 8000 MUENCHEN, DE
分类号 H01L21/285;H01L29/423;H01L29/45 主分类号 H01L21/285
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