| 摘要 |
<p>PURPOSE:To enable various kinds of inspection without disconnecting a short- circuit part by providing optical resistance elements to row electrode lines and column electrode lines on an array substrate and connection parts of short- circuit parts of respective wires in series. CONSTITUTION:Respective wires of the row electrode lines b1-b5 and column electrode lines a1-a6 on the array substrate are short-circuited through the optical resistance elements d1-d6, e1-e5, f1-f5, and g1-g6, so the optical resistance elements d1-d6, e1-e5, f1-f5, and g1-g6 are reduced in resistance by light irradiation to short circuit the respective a1-a6 and b1-b5, thereby preventing switching elements c1 and c2 from breaking electrostatically. Further, said optical resistance elements are increased in resistance by cutting the light to increase the resistance between the electrode lines a1-a6 and b1-b5 until a short circuit between lines can be inspected. Consequently, the wiring inspection is performed without disconnecting and removing the short-circuit part from the substrate.</p> |
