TRUNK CIRCUIT TESTING SYSTEM,申请号JP19880132652-传众专利搜索

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发明名称	TRUNK CIRCUIT TESTING SYSTEM
摘要
申请公布号	JPH01303847(A)	申请公布日期	1989.12.07
申请号	JP19880132652	申请日期	1988.06.01
申请人	HITACHI LTD	发明人	KOGURE YASUO;SUZUKI TOSHIAKI
分类号	H04M3/32	主分类号	H04M3/32
代理机构		代理人
主权项
地址

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