发明名称 APPEARANCE INSPECTING DEVICE
摘要 PURPOSE:To shield disturbing light accurately without causing a trouble in the transport of an object to be inspected, by moving a shielding plate to a disturbing light shielding position when an object to be inspected reaches an inspecting position to shift the shielding plate outside a moving locus of the object to be inspected after the end of picking up. CONSTITUTION:When a semiconductor device 1a reaches an inspecting position, a shielding plate 17 positioned at a rising position is lowered. Light from a light source other than a lighting device 19 is shielded. The semiconductor device 1a is irradiated with a light G photographable from the lighting device 19 synchronizing the shielding action and a bending of a lead is inspected by taking the semiconductor device 1a with a camera 12a. After a fixed time necessary for inspection of appearance passes, an output of the camera is cut off. The shielding plate 17 is lifted by an output of a control circuit synchronizing a timing of ending the photography and then, retracted outside a moving locus of the semiconductor device 1a.
申请公布号 JPH01302146(A) 申请公布日期 1989.12.06
申请号 JP19880133361 申请日期 1988.05.31
申请人 MATSUSHITA ELECTRON CORP 发明人 OHARA HIDEAKI
分类号 G01N21/84;G01N21/88;G01N21/956 主分类号 G01N21/84
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