| 摘要 |
PURPOSE:To reduce the test time and to save man-hour by attaining the test of plural OR array drivers at the same time in a PLD having a test circuit of an OR array driver to drive the OR array section. CONSTITUTION:A PLD(Programmable Logic Device) has a test circuit for an OR array driver 3 to drive an OR array section 4. Then an OR dummy array section 7A is grouped and the resulting groups are selected simultaneously in parallel to test the OR array driver 3, then plural OR array drivers 3 are tested at once. Thus, the PLD is obtained, in which the test time is reduced and man-hour is saved. |
