| 摘要 |
<p>The instrument carries out the measurement of optical scattering matrices of material samples by means of the detection, and subsequent computer Fourier analysis, of a periodic intensity signal of a light beam, emitted by a dye-laser (F) or a polychromatic source-monochromator set (F), that passes through the following ordered elements: a first polariser (P-1), a first rotating optical retarder (R-1), the sample (S), a second rotating optical retarder (R-2) and a second polariser (P-2). The light source, the polariser and the rotating optical retarder are arranged on an optical bench, while a second rotating retarder, fixed polariser and detector are arranged on a second optical bench. The rotation of both optical retarders, the selection of different wavelengths of the light beam and the selection of different angular orientations of the benches are automatically performed by computer controlled motors and positioners.</p> |
