发明名称 |
MANUFACTURE OF ELECTRODE ON SEMICONDUCTOR BODY |
摘要 |
The manufacturing method of the semiconductor multi layer interconnection for preventing the short has the following steps: (a) depositing metal layer (3) with chemical stability to prevent hillock of Aluminium metal layer (2) formed on a oxide layer (1) ; (b) forming a pattern by etching the metal layer (2,3) ; (c) depositing LTO (low temperature oxide layer) (4) to imsulate ; (d) forming a contact window (5) by etching the LTO (4) and metal layer (3) ; (e) forming a second metal interconnection pattern by using the second Al metal layer (6).
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申请公布号 |
KR890004875(B1) |
申请公布日期 |
1989.11.30 |
申请号 |
KR19870005960 |
申请日期 |
1987.06.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD |
发明人 |
AN YONG-CHEOL;SONG CHANG-RYONG;PARK MUN-JIN |
分类号 |
H01L21/60;(IPC1-7):H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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