发明名称 MANUFACTURE OF ELECTRODE ON SEMICONDUCTOR BODY
摘要 The manufacturing method of the semiconductor multi layer interconnection for preventing the short has the following steps: (a) depositing metal layer (3) with chemical stability to prevent hillock of Aluminium metal layer (2) formed on a oxide layer (1) ; (b) forming a pattern by etching the metal layer (2,3) ; (c) depositing LTO (low temperature oxide layer) (4) to imsulate ; (d) forming a contact window (5) by etching the LTO (4) and metal layer (3) ; (e) forming a second metal interconnection pattern by using the second Al metal layer (6).
申请公布号 KR890004875(B1) 申请公布日期 1989.11.30
申请号 KR19870005960 申请日期 1987.06.12
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 AN YONG-CHEOL;SONG CHANG-RYONG;PARK MUN-JIN
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
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