发明名称 PROCESS AND DEVICE FOR MEASURING SURFACES
摘要 <p>To measure a surface in a space by means of at least two theodolites, a light spot is projected onto the surface by one of the theodolites and said light spot is sighted with the other theodolite or theodolites. Its position in space is thereby trigonometrically determined. In order to improve the accuracy of said process, the axis of the beam projecting the light spot describes a circular cone. The central point of the ellipse detected by the observation theodolite(s) is used as the representative target point for trigonometrically determining the position of the surface element on the surface to be measured. Preferably the annular irradiance distribution detected by the receiver theodolite(s) is approximated by a compensating ellipse. Even in the case of very homogeneously ragged surfaces, systematic errors in position measurements caused by the &quot;Speckle effect&quot; are reduced.</p>
申请公布号 WO1989011630(A1) 申请公布日期 1989.11.30
申请号 EP1989000598 申请日期 1989.05.26
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