| 摘要 |
A method for monitoring the coating weight, uniformity, defects or markings present in a coating of a composition applied to a substrate comprises the steps: a) providing a substrate with a functional coating of a composition comprising an effective amount of uvescer that absorbs radiant energy, i.e., has an excitation energy, of wavelength lambda 1 and emits radiant energy of wavelength lambda 2; b) scanning the coating with radiant energy having a wavelength within wavelength lambda 1; c) detecting the radiant energy of wavelength lambda 2 emitted by the coating; and d) optionally, correlating the emitted radiant energy to independently measured standard coating weights or thicknesses, of the coating so as to measure coating weight, thickness, uniformity, defects, or markings. i |
