Testing integrated circuits,申请号GB19880011863-传众专利搜索

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发明名称	Testing integrated circuits
摘要
申请公布号	GB2218816(A)	申请公布日期	1989.11.22
申请号	GB19880011863	申请日期	1988.05.19
申请人	* THE PLESSEY COMPANY PLC	发明人	JONATHAN * BRADFORD
分类号	G01R31/3185	主分类号	G01R31/3185
代理机构		代理人
主权项
地址

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