| 摘要 |
PURPOSE:To realize the inference of an abnormal area even with an unestimated factor by forming the knowledge used for inference of the factor of the abnormality based on a knowledge base obtained by expressing quantitatively and qualitatively the characteristics of a normal state produced for each component device of a plant. CONSTITUTION:The factor of abnormality is inferred based on the knowledge obtained by expressing quantitatively and qualitatively the characteristics of a normal time produced for each component device and stored in a knowledge base 6 and the knowledge of the causal relation between the factor of a trouble and an event. For instance, an abnormal event Z is detected by an abnormality detection processing part 4. Thus an abnormality factor inferring part 5 starts its search at and after a device 5 that has the event Z as an output data and compares the normal characteristic knowledge of each device with the qualitative/qualitative data. Thus the device that causes the abnormality is specified and furthermore the trouble factor can be inferred from the knowledge of the causal relation between the trouble factor and an event contained in the knowledge of said specified device. |
