| 摘要 |
PURPOSE:To facilitate and shorten a test by providing a domino circuit with the output signal of a micro-ROM as a gate input and fetching its output as a checking signal. CONSTITUTION:When a test, by making a test signal T25 'H', gate signals 1e-1h all become 'H' and all transistors in a ROM 10 and a micro-RM 1 are turned on. Consequently, output signals 3-9 and an output signal 11 of the ROM 10 all become 'H' and a check signal C12 becomes 'L'. When there are disconnections in the lines of the gate signals 1e-1h, the ROM 10 does not become ON, the check signal C12 become 'H' and an error is shown. When there is a disconnection in a diffusion area, the output signals 3-9 becomes 'H' and an error is shown. When there is a disconnection in a diffusion area, the output signals 3-9 become 'L', in the same way, the check signal C12 becomes 'H' and an error is shown. Thus, by only making the test signal T 'H', the disconnections of the gate or diffusion wiring can be checked instant ly and the test can be facilitated and shortened. |
