INSPECTION OF SEMICONDUCTOR DEVICE,申请号JP19880115819-传众专利搜索

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发明名称	INSPECTION OF SEMICONDUCTOR DEVICE
摘要
申请公布号	JPH01285875(A)	申请公布日期	1989.11.16
申请号	JP19880115819	申请日期	1988.05.12
申请人	MATSUSHITA ELECTRON CORP	发明人	YONESHIMA SHINTARO
分类号	G01R31/26;H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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