发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To increase the density and degree of integration of a memory cell by arranging a capacitor between a floating gate and a semiconductor substrate. CONSTITUTION:A semiconductor memory device includes: a selecting transistor TR2 formed on a semiconductor substrate 11 and having a gate region 3a as part of a word line 3a; a first insulating film 6 thinly formed on a selecting part of a drain region 8 of the selecting transistor TR2; a floating gate 2 formed on a region including the insulating film 6; and a control gate 1 formed through a second insulating film 12 having a tunnel region 12a. A capacitor is formed between the floating gate 2 and the semiconductor substrate 11. Accordingly, a high density and highly integrated memory cell can be obtained.
申请公布号 JPH01283968(A) 申请公布日期 1989.11.15
申请号 JP19880115256 申请日期 1988.05.11
申请人 MITSUBISHI ELECTRIC CORP 发明人 ARIMA HIDEAKI;AJIKA NATSUO;FUJINAGA MASATO;HOSONO KUNIHIRO
分类号 H01L21/8247;H01L21/8246;H01L27/112;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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