发明名称 |
SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE:To increase the density and degree of integration of a memory cell by arranging a capacitor between a floating gate and a semiconductor substrate. CONSTITUTION:A semiconductor memory device includes: a selecting transistor TR2 formed on a semiconductor substrate 11 and having a gate region 3a as part of a word line 3a; a first insulating film 6 thinly formed on a selecting part of a drain region 8 of the selecting transistor TR2; a floating gate 2 formed on a region including the insulating film 6; and a control gate 1 formed through a second insulating film 12 having a tunnel region 12a. A capacitor is formed between the floating gate 2 and the semiconductor substrate 11. Accordingly, a high density and highly integrated memory cell can be obtained. |
申请公布号 |
JPH01283968(A) |
申请公布日期 |
1989.11.15 |
申请号 |
JP19880115256 |
申请日期 |
1988.05.11 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
ARIMA HIDEAKI;AJIKA NATSUO;FUJINAGA MASATO;HOSONO KUNIHIRO |
分类号 |
H01L21/8247;H01L21/8246;H01L27/112;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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