发明名称 DEVICE TROUBLE PLACE AND CLASSIFICATION INDICATING SYSTEM
摘要 PURPOSE:To immediately analyze and decice the generated error event and the generated place by providing error analyzing definition data to correspond plural log patterns determined by the trouble classification to the trouble place and the trouble classification and make in into a table in correspondence to the trouble generating place of respective devices. CONSTITUTION:At a main body device side, error analyzing definition data 54 to make plural log patterns 11 determined by a trouble place 12 and a trouble classification 13 into the table for respective devices from logging data 1 obtained when an abnormality occurs at respective devices are provided. The error analyzing definition data 54 are referred to for device correspondence, the trouble place 12 is decided, the number of the times of logging generation specified by the trouble place 12 is obtained, a log pattern for the number of the times of the logging generation is extracted, the log pattern in the error analyzing definition data is compared and the trouble classification 13 of the error place is indicated. Thus, the place and classification of the trouble can be analyzed for the device trouble, a person in charge of maintenance can instantaneously cope with the said trouble and a maintenance service can be improved.
申请公布号 JPH01282648(A) 申请公布日期 1989.11.14
申请号 JP19880113165 申请日期 1988.05.10
申请人 FUJITSU LTD 发明人 YAJIMA KUNIO;MURASE YASUFUMI
分类号 G06F11/22 主分类号 G06F11/22
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