INTEGRIERTE HALBLEITERSCHALTUNG UND VERFAHREN ZUM TESTEN DERSELBEN

摘要

A semiconductor integrated circuit for use in, for example, computers, electronic control systems and the like, is provided. The integrated circuit contains a plurality of tested circuits which need be tested, prior to actual use, as to whether they can perform their assigned logic functions. A pair of shift registers are connected to the input and output of each tested circuit, respectively. An externally applied selection signal selects only one pair of shift registers at a time so that a particular tested circuit is specified and the application of a test signal and the derivation of a test result to and from the specified tested circuit become possible. The structure and testing method enables reduction of the number of clock signals required for testing and, hence, the number of clock signal input terminals on the integrated circuit.