PROCESS AND DEVICE FOR MEASURING THE THICKNESS OF THIN METALLIC COATINGS DEPOSITED ON A CONDUCTIVE SUPPORT

摘要

A method and apparatus for measuring the thickness of thin metallic layers deposited on a conductive support, wherein the thickness is determined from the measurement of the losses corresponding to the Joule effect, due to the eddy currents which appear when a magnetic circuit excited by an alternating voltage is brought close to the metallic surface.