发明名称 |
KUPFERLEGIERUNGSMATERIAL FUER LEITUNGSRAHMEN VON HALBLEITERVORRICHTUNGEN |
摘要 |
A copper alloy material for lead frames for semiconductor devices. The lead frame material consists essentially of: Ni: 0.5-2 percent by weight; Sn: 1.2-2.5 percent by weight; Si: 0.05-0.5 percent by weight; Zn: 0.1-1 percent by weight; Ca: 0.001-0.01 percent by weight; Mg: 0.001-0.05 percent by weight; Pb: 0.001-0.01 percent by weight; and Cu and inevitable impurities: the balance. The lead frame material obtained possesses not only high strength, but also excellent thermal-exfoliation resistance of the solder, and also enhances the wear resistance of the stamping dies, while possessing excellent other properties, such as repeated-bending strength, thermal conductivity and electrical conductivity, platability, and solderability, which are required of lead frames. |
申请公布号 |
DE3908513(A1) |
申请公布日期 |
1989.11.09 |
申请号 |
DE19893908513 |
申请日期 |
1989.03.15 |
申请人 |
MITSUBISHI SHINDOH CO., LTD., TOKIO/TOKYO, JP |
发明人 |
FUTATSUKA, RENSEI;CHIBA, SYUN-ICHI;SAKAKIBARA, TADAO, AIZUWAKAMATSU, FUKUSHIMA, JP |
分类号 |
C22C9/00;C22C9/02;H01L23/48;H01L23/495 |
主分类号 |
C22C9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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