发明名称 Dynamic random access memory having storage gate electrode grounding means
摘要 A dynamic RAM provided on a semiconductor substrate comprises: a memory cell including a capacitor for storing electric charges as information, the capacitor having a storage gate electrode to which a potential other than a ground potential is applied during normal operation of the dynamic RAM; a peripheral circuit including a CMOS circuit; and grounding means for applying the ground potential to the storage gate electrode only in a predetermined period immediately after a start of application of a power supply voltage to the dynamic RAM.
申请公布号 US4879679(A) 申请公布日期 1989.11.07
申请号 US19880163017 申请日期 1988.03.02
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KIKUDA, SHIGERU;MIYAMOTO, HIROSHI
分类号 G11C11/404;G11C11/4072;G11C11/4074;H01L21/8242;H01L27/08;H01L27/10;H01L27/108 主分类号 G11C11/404
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