发明名称 |
Dynamic random access memory having storage gate electrode grounding means |
摘要 |
A dynamic RAM provided on a semiconductor substrate comprises: a memory cell including a capacitor for storing electric charges as information, the capacitor having a storage gate electrode to which a potential other than a ground potential is applied during normal operation of the dynamic RAM; a peripheral circuit including a CMOS circuit; and grounding means for applying the ground potential to the storage gate electrode only in a predetermined period immediately after a start of application of a power supply voltage to the dynamic RAM.
|
申请公布号 |
US4879679(A) |
申请公布日期 |
1989.11.07 |
申请号 |
US19880163017 |
申请日期 |
1988.03.02 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
KIKUDA, SHIGERU;MIYAMOTO, HIROSHI |
分类号 |
G11C11/404;G11C11/4072;G11C11/4074;H01L21/8242;H01L27/08;H01L27/10;H01L27/108 |
主分类号 |
G11C11/404 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|