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发明名称
SAMPLE FOR ELECTRON MICROSCOPE
摘要
申请公布号
JPH01274032(A)
申请公布日期
1989.11.01
申请号
JP19880104805
申请日期
1988.04.27
申请人
SEIKO EPSON CORP
发明人
MUTO RIEKO
分类号
G01N1/32;(IPC1-7):G01N1/32
主分类号
G01N1/32
代理机构
代理人
主权项
地址
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