A METHOD OF TESTING AN INTEGRATED CIRCUIT AND ONE OR MORE ASSOCIATED MASKS,申请号GB19890021087-传众专利搜索

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发明名称	A METHOD OF TESTING AN INTEGRATED CIRCUIT AND ONE OR MORE ASSOCIATED MASKS
摘要
申请公布号	GB8921087(D0)	申请公布日期	1989.11.01
申请号	GB19890021087	申请日期	1989.09.18
申请人	JONES, ROBERT H	发明人
分类号	G01R31/305;G01R31/308	主分类号	G01R31/305
代理机构		代理人
主权项
地址

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