| 摘要 |
PURPOSE:To simply and surely detect the generation of a fault by detecting a fact that a clock waveform does not exist in a signal outputted from a semiconductor integrated circuit and deciding abnormality of the semiconductor integrated circuit. CONSTITUTION:The semiconductor integrated circuit is constituted so that a digital signal is outputted by adding a waveform of a clock signal at every machine cycle, and based on existence of a clock waveform which appears at every machine cycle of a signal outputted from this semiconductor integrated circuit, abnormality of the semiconductor integrated circuit is detected. That is, when the semiconductor integrated circuit which is integrated in as a system is broken down due to a mechanical impact, heat or a surge voltage, etc., a state of a signal in the inside and the outside of the semiconductor integrated circuit concerned is fixed to a high level or a low level, by which the clock waveform which is added to an output signal of the semiconductor integrated circuit in a normal state comes not to exist. In such a way, the generation of a fault related to the semiconductor integrated circuit or a prescribed signal is detected, and safety of the system can be secured instantly and surely. |
