CAPACITANCE MEASURING CIRCUIT OF SEMICONDUCTOR,申请号KR19860013827U-传众专利搜索

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发明名称	CAPACITANCE MEASURING CIRCUIT OF SEMICONDUCTOR
摘要
申请公布号	KR890007612(Y1)	申请公布日期	1989.10.30
申请号	KR19860013827U	申请日期	1986.09.08
申请人	GOLDSTAR CO.,LTD.	发明人	RYU, SHI-KWAN
分类号	G01R27/26;(IPC1-7):G01R31/26	主分类号	G01R27/26
代理机构		代理人
主权项
地址

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