发明名称 OMISSION CHECKING METHOD FOR PICTURE PROCESSING
摘要 PURPOSE:To enhance checking accuracy and to shorten a checking time by binarizing picture data, and scanning only the linear peripheral part of the binarized picture data. CONSTITUTION:A check is executed as follows. First, based on the two-dimensional binarized picture data stored into a picture memory 5, a scanning area Wn including the picture data of a linear peripheral part Ln where the omission of the object to be checked is checked is set. Next, the primary straight line expression of the linear peripheral part Ln in the respective scanning areas Wn is calculated. For example, L1=a1x+b1 is obtained. Next, the coordinates of the intersection of the primary straight line expression corresponding to the respectively adjacent linear peripheral parts for the obtained primary straight line expression are obtained. Then, for the obtained section between the adjacent intersection coordinates, whether or not an omission exists in the peripheral part of the object to be checked is scanned along the primary straight line expression. Further, the obtained depth and width of the omission are compared with the values set beforehand, and whether or not it is a defective commodity is decided.
申请公布号 JPH01263774(A) 申请公布日期 1989.10.20
申请号 JP19880091923 申请日期 1988.04.14
申请人 HITACHI METALS LTD 发明人 MATSUBARA TOSHINORI
分类号 H01L21/66;G06T1/00 主分类号 H01L21/66
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