Process and apparatus for measuring the elasticity of a superficial layer, especially the skin.

摘要

The process for measuring the elasticity of a superficial layer (2), especially of the skin, consists in demarcating an area (7) of this layer; in creating, over this area, a low pressure to cause said area to deform; and in measuring the low pressure required to bring about a deformation of predetermined amplitude. The measuring device comprises a probe (3) provided with a cavity (5) demarcated by a rim (6) which can be applied to the layer (2) under study, and means (17) for creating a low pressure in the cavity (5). A suction orifice (20) is provided in the cavity at a predetermined distance (d) from the superficial layer in such a way as to be closed off by said layer when the deformation reaches the predetermined amplitude. Means (14) for measuring the low pressure that has produced the deformation of predetermined amplitude are provided.
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